Acta mathematica scientia,Series A ›› 2003, Vol. 23 ›› Issue (5): 607-612.

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Potential Function Model of Uniformity Measurement

 HU Dong-Hong, LI De-Hua, WANG Zu-Xi   

  1. 华中科技大学图像所 图像信息处理与智能控制国家教委开放研究实验室  武汉 430074 湖北大学物理学与电子技术学院 武汉 430062
  • Online:2003-10-25 Published:2003-10-25
  • Supported by:

    国家973计划资助项目(G1999054400)

Abstract:

The basic characteristics that  any criterion of uniformity measurement  should have are discussed. According to the model of physics potential and forc e, a new criterion of uniformity measurement, potential function model of unifor mity measurement, is proposed. The model  not only can solve the problems suc h as  computability and the adjustable character for uniformity, but also has all the  good characters, which a uniformity measurement should have, such as rotation s ymmetry , translation symmetry and center reflection symmetry. An example is shown and  the uniformity of lower dimension projection is discussed at the end.

 

Key words: Experiment design, Uniform design, Uniform measurement, Potential function

CLC Number: 

  • 62E20
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