Acta mathematica scientia,Series A

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Quadratic Finite Volume Element Method Along Characteristics

for the Semiconductor Device of Heat Conduction:

H1Error Estimates

Chen Chuanjun; Yuan Yirang   

  1. Department of Mathematics, Yantai University, Yantai 264005;

    School of Mathematics and System Sciences, Shandong University, Jinan 250100;

  • Received:2006-02-16 Revised:2007-09-22 Online:2008-06-25 Published:2008-06-25
  • Contact: Chen Chuanjun

Abstract: A fully discrete quadratic finite volume element method along characteristics for the semiconductor device of heat conduction is given, which is used by piecewise lagrange quadratic trial function and piecewise constant test function. Under general conditions, an optimal H1 error estimate is obtained.

Key words: Semiconductor, Method of characteristics, Finite volume methods, Error estimate

CLC Number: 

  • 65M
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