波谱学杂志 ›› 1992, Vol. 9 ›› Issue (4): 361-367.

• 研究论文 • 上一篇    下一篇

电子束蒸发a-Si1-xNdx薄膜的ESR研究

甘润今, 张津燕, 陈光华   

  1. 兰州大学物理系, 兰州 730000
  • 收稿日期:1991-06-07 修回日期:1991-10-30 出版日期:1992-12-05 发布日期:2018-01-20

ESR STUDIES OF ELECTRON BEAM EVAPORATED a-Si1-xNdx FILMS

Gan Runjing, Zhang Jinyan, Chen Guanghua   

  1. Dept. of Physics, Lanzhou University, Lanzhou 730000
  • Received:1991-06-07 Revised:1991-10-30 Online:1992-12-05 Published:2018-01-20

摘要: 研究了电子束蒸发a-Si1-xNdx的薄膜的ESR参数g因子、线型因子l,峰-峰线宽△Bpp、自旋密度Ns随组分x变化的特性.基于这类薄膜的光吸收和电导特性,应用带Nd背键的悬挂键模型分析讨论了这些变化特性的物理原因.

关键词: 稀土元素, 合金薄膜, 悬挂键, 电子自旋共振

Abstract: The variation of ESR parameters, such as g factor, line-shape factor (l), peak to peak linewidth (ΔBpp) and spin density (Ns), with the composition (x) for electron beam evaporated a-Si1-xNdx films was studied. Based on the optical absorption and conductive properties in this kind of alloy films, using the dangling bond model with Nd back bonds, the variation of properties are analyzed and discussed.

Key words: Rare earth element, Alloy film, Dangling bond, ESR